ezHEMS

Description

The NanoMagnetics Instruments ezHEMS (Hall Effect Measurement System) is an integrated platform used to characterize the electrical properties of materials through Hall Effect and magneto-resistance measurements. It combines hardware and a LabVIEW®-based control system to perform current–voltage (I–V) and resistance–temperature (R–T) analyses with real-time data acquisition. The system supports a wide temperature range (80 K to 800 K) and flexible probe configurations (4, 6, or 8 contacts), enabling efficient testing without reconfiguring the sample setup. It is widely used for evaluating semiconductors, multilayer devices, and both organic and inorganic conductive materials.

Capabilities

• Wide temperature range (80 K – 800 K) – Enables characterization under cryogenic to high-temperature conditions 
• Multiple probe configurations (4, 6, or 8 contacts) – Supports Van der Pauw and Hall bar measurement techniques 
• I–V measurements – Evaluates current–voltage behavior of materials 
• R–T measurements – Determines resistance changes as a function of temperature 
• Magnetic field application (6000–10000 G) – Allows Hall Effect and magneto-resistance analysis 
• Automated parameter calculation – Determines resistivity, Hall coefficient, carrier concentration, carrier type, and mobility 
• Real-time data acquisition and feedback – Improves efficiency and monitoring during experiments 
• Broad material compatibility – Suitable for semiconductors (e.g., GaAs, Si, Ge), compound materials, metal oxides, and organic conductors