Description
The FEI Talos™ f200i S/TEM is a 200 kV field emission (scanning) transmission electron microscope that has been designed for fast, precise and quantitative characterization of nanomaterials; achieving atomic resolution. With column alignments at 120 kV and 200 kV the Talos™ f200i S/TEM is capable of imaging a broad range of materials science and biological samples.
The S/TEM column is fully automated, equipped with a S-FEG, isolated vacuum system for the electron gun, symmetric X-TWIN objective lens, computerized 5 axes eucentric goniometer, diffraction lens, intermediate lens, two projector lenses, fast survey camera, and a vibration-free vacuum system.
Techniques include: brightfield (BF), darkfield (DF), high resolution-TEM (HR-TEM for crystalline samples), diffraction, selected area electron diffraction (SAED), nanobeam diffraction, convergent beam electron diffraction (CBED), scanning transmission electron microscopy (STEM), high resolution-STEM (HR-STEM), and Energy Dispersive X-Ray Spectroscopy (EDS).
Capabilities
- Accelerating Voltage
120kV and 200kV - Magnification Range:
25x - 1,050,000x - Resolution:
- TEM line resolution: ≤ 0.12 nm STEM line resolution: ≤ 0.16 nm
- Diffraction Performance:
Maximum full convergence angle (LACBED): ≥ 100 mrad Maxiumum diffraction angle: 24° - Stage & Stability
Z-movement: ± 0.375 mm Maximum tilt (double tilt holder): α ± 35°, β ± 30° Specimen drift: ≤ 0.5 nm/min - Detection & Software
4k × 4k CETA 16M CMOS Camera 30 mm² retractable Bruker X-Flash™ 6|30 EDS detector Velox™ advanced acquisition and processing software - Sample Holders
Single tilt holder Single tilt holder Low background double tilt HIVis holder
Related Equipment:
Location: SUPP 171
Model: FEI TALOS f200i
Generously funded by The Materials Applications Research Center (MARC)