CRO Microscopy Equipment

Icon AFM incorporates the latest evolution of Bruker’s nanoscale imaging and characterization technologies on a large sample tip-scanning AFM platform. 

Please contact ARSC Staff to purchase consumables. Consumable costs are outside of the monthly project cap. Contact us at analysisrsc@txstate.edu if you have any questions.

The FILMETRICS Optical Profiler uses a state-of-the-art non-contact optical method for measuring surface profiles and roughness, white light interferometry (WLI). White light interferometry measures surface profiles and roughness down to 0.05µm; adding the low-cost phase shifting interferometry (PSI) option takes the minimum vertical feature size down to 0.001µm.

The newest generation of the Profilm3D non-contact optical profilometer offers Enhanced Roughness mode for accurately imaging rough surfaces and highly-sloped sidewalls.

The Hirox Digital Microscope allows for quick and easy, calibrated, high-precision, non-contact 2D and 3D measurements of your specimens over a broad magnification range.

Scanning Electron Microscopes raster a focused electron beam across the surface of a sample to generate grey scale images with resolution below what can be achieved with conventional light microscopes (20-50nm).  Our JEOL 6010 SEM can operate in high or low vacuum mode to accommodate samples that outgas (e.g. biological) and is equipped with a liquid nitrogen cold stage, Cathodoluminescence (CL) Spectrometer, and Electron Dispersive Spectroscopy (EDS) detector for elemental analysis.

The Olympus FV3000 laser scanning confocal microscope is designed for high-resolution confocal observation of fixed and living cells, point-detection, spectral detection that does variable bandwidth filtering, high efficiency of excitation, 3-D imaging, and time course experiments. 

The Olympus BX60M optical microscope is capable of magnifications from 5-100x. Digital image acquisition and post processing is available. Additionally, the system is capable of simple polarized light microscopy and Nomarski interference contrast microscopy. Nomarski interference contrast microscopy uses the comparison of the different optical path lengths of a sample to image otherwise invisible features. This is commonly used for imaging unstained biological samples and defects in thin semiconductor samples.

Raman-AFM-TERS. HORIBA's leading Raman technology is now integrated with AIST-NT’s scanning probe microscopy (SPM). The NanoRamanTM platform integrates Atomic Force Microscopy (AFM) that can provide physical sample information on the nanometer scale, including topography, hardness, adhesion, friction, surface potential, electrical and piezo response (among many others), Scanning Tunneling Microscopy (STM), tuning fork techniques (Shear-force and Normal-force imaging modes), electrochemistry, all together with the chemical information obtained from Raman spectroscopy.

The DektakXT® stylus surface profiler is an advanced thin and thick film step height measurement tool.

The FEI Talos™ f200i S/TEM is a 200 kV field emission (scanning) transmission electron microscope that has been designed for fast, precise and quantitative characterization of nanomaterials; achieving atomic resolution.

Please contact ARSC Staff to purchase consumables. Consumable costs are outside of the monthly project cap. Contact us at analysisrsc@txstate.edu if you have any questions.

The Zeiss Axio Incubation Microscope is an inverted fluorescence incubation microscope equipped with CO₂ and temperature control designed for live cell imaging, advanced biological research and automated fluorescence imaging.