Description
The HORIBA Time-Resolved Photoluminescence (TRPL) system extends conventional PL measurements by capturing the temporal dynamics of light emission after pulsed excitation. Instead of only measuring emission intensity vs. wavelength, TRPL measures how emission intensity decays over time, providing insight into carrier lifetimes and recombination mechanisms.
The system uses pulsed diode lasers (e.g., 375 nm and 532 nm) and specialized detectors (e.g., PPD-900) to perform time-correlated single photon counting (TCSPC) or similar lifetime measurements.
Capabilities
- Time-resolved photoluminescence (lifetime measurements) - Determines excited-state lifetimes and recombination rates
- Pulsed laser excitation - 375 nm and 532 nm diode lasers for controlled excitation timing
- Single-photon counting detection - High-sensitivity detection of emission decay (TCSPC)
- Simultaneous spectral and temporal analysis - Combines wavelength-resolved PL with time decay measurements
- Carrier dynamics analysis - Investigates radiative vs. non-radiative recombination processes
- Microscale spatial resolution - Integrated microscope and motorized stage for localized measurements
- Adjustable optical configuration - Variable gratings, filters, and slit widths for optimized resolution
- Advanced data acquisition - Real-time display (RTD), decay curves, and instrument response function (IRF) measurements
- Applications in advanced materials - Semiconductors, quantum dots, perovskites, LEDs, and photovoltaic materials
Location: RFM 1202
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