CRO Spectroscopy Equipment

The Analysis Research Service Center (ARSC) spans multiple locations in the Roy F. Mitte (RFM) and Jerome C. Supple (SUPP) buildings and hosts equipment utilized to probe the structure, composition, and electrical/magnetic properties of matter. Various photon energies are utilized for spectroscopic interrogation from infrared to x-ray wavelengths revealing information such as bond energy, crystal structure, and stoichiometry.

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  • Fourier-transform infrared (FTIR)

    The Fourier-transform infrared (FTIR) spectrometer utilizes broadband IR radiation to probe the vibrational modes of molecule in a liquid, powder, bulk, or thin film sample. 

  • Inductively Coupled Plasma Mass Spectrometer (ICP-MS)

    The Agilent 8900 is an Inductively Coupled Plasma Mass Spectrometer (ICP-MS) used for high purity material and contaminant concentrations with detection limits in the parts per trillion.  This particular ICP-MS has three quadrupoles that ultimately determine the mass range of analyte molecules entering the detector. The second quadrupole is a special cell where up to 4 gases can be used in collision (He) or reaction (O2, H2, etc.) mode to further separate or create specific ions of interest.

  • Nexsa XPS

    X-ray Photoelectron Spectroscopy is primarily used to probe the bond configurations of atoms in the top 2-10 nm of a thin film specimen.  Soft X-ray radiation (from Al and/or Mg sources, need both to distinguish XPS from Auger) is directed at the sample to induce emission of inner shell electrons.  Measuring the characteristic kinetic energy of the emitted electrons is used to determine their binding energy and therefore what atom they came from as well as the local bonding scheme.

  • UV-Vis Spectrometer

    UV-Vis Spectrometer is an instrument used to measure properties of light over visible and ultraviolet portion of the electromagnetic spectrum, typically used in spectroscopic analysis to identify materials.

  • X-ray Diffractometer (XRD)

    Our Rigaku SmartLab X-ray Diffractometer (XRD) is utilized to probe the crystalline structure of matter to determine thickness, composition, relaxation, strain, area uniformity, density, roughness, phase, crystalline texture, % crystallinity, and pore/grain size of both thin films and powder samples. 

  • X-Ray Fluorescence Spectrometer (XRF)

    The Rigaku Supermini200 is a benchtop wavelength dispersive X-Ray Fluorescence (WDXRF) Spectrometer capable of measuring elemental concentrations (Aluminum through Uranium) present in solid, thin film, powder, and liquid specimens.  Sample preparation is simple and this unit can be loaded with up to 12 samples up to 44mm diameter for batch processing.

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